Minuti, M.M.MinutiSgrò, C.C.SgròBaldini, L.L.BaldiniBellazzini, R.R.BellazziniBrez, A.A.BrezCastellano, S.S.CastellanoDi Lalla, N.N.Di LallaLatronico, L.L.LatronicoMaldera, S.S.MalderaManfreda, A.A.ManfredaPesce-Rollins, M.M.Pesce-RollinsSpandre, G.G.SpandreBarbanera, M.M.BarbaneraCitraro, S.S.CitraroLucchesi, L.L.LucchesiMagazzù, C.C.MagazzùMagazzù, G.G.MagazzùMereu, P.P.MereuMosti, F.F.MostiNuti, A.A.NutiOrsini, L.L.OrsiniNasimi, H.H.NasimiPinchera, M.M.PincheraZanetti, D.D.ZanettiBorotto, F.F.BorottoCeccanti, M.M.CeccantiMarengo, M.M.MarengoProfeti, A.A.ProfetiCaporale, C.C.CaporaleCardelli, C.C.CardelliTardiola, M.M.TardiolaAmici, F.F.AmiciAttinà, P.P.AttinàBachetti, M.M.BachettiBrienza, D.D.BrienzaCentrone, M.M.CentroneCosta, E.E.CostaDel Monte, E.E.Del MonteDi Cosimo, S.S.Di CosimoDi Marco, A.A.Di MarcoDi Persio, GiuseppeGiuseppeDi PersioEvangelista, Y.Y.EvangelistaFabiani, S.S.FabianiFerrazzoli, R.R.FerrazzoliLa Monaca, F.F.La MonacaLefevre, C.C.LefevreLoffredo, P.P.LoffredoMorbidini, A.A.MorbidiniMuleri, F.F.MuleriPerri, M.M.PerriPiazzolla, R.R.PiazzollaPilia, M.M.PiliaRankin, J.J.RankinRatheesh, A.A.RatheeshRubini, A.A.RubiniSantoli, F.F.SantoliScalise, E.E.ScaliseSoffitta, P.P.SoffittaTobia, A.A.TobiaTrois, A.A.TroisXie, F.F.XieCarpentiero, RitaRitaCarpentieroCastronuovo, Marco MariaMarco MariaCastronuovoCavazzuti, ElisabettaElisabettaCavazzutiD'Amico, FabioFabioD'AmicoDonnarumma, ImmacolataImmacolataDonnarummaNegri, BarbaraBarbaraNegriPuccetti, S.S.PuccettiCavalli, L.L.CavalliD’Alba, E.E.D’AlbaLorenzi, P.P.LorenziMangraviti, E.E.MangravitiSarra, P.P.SarraSciortino, A.A.SciortinoVimercati, M.M.VimercatiPieraccini, S.S.PieracciniZanetti, F.F.Zanetti2024-05-172024-05-172023-08-25https://hdl.handle.net/20.500.13025/6447With the specialization of VLSI ASICs for front-end signal processing electronics, the customization of the control back-end electronics (BEE) has become critical to fully deploy the ASIC performance. In the context of space operations, with typical constraints on power and reliability, the design and qualification of such integrated systems present significant challenges. In this paper, we review the design and performance of the BEE systems after two years of operations in low Earth orbit (LEO); these systems read out the custom ASICs inside the gas pixel detectors, which are located at the heart of the imaging X-ray polarimetry explorer (IXPE), a NASA-ASI small explorer mission designed to measure X-ray polarization in the 2–8 keV energy range. © 2023 by the authors.enASICCMOSelectronicshigh-reliability electronicsSEEX-ray detectorsjournal article10.3390/electronics12173589https://www.mdpi.com/2079-9292/12/17/3589