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Compact and low power on-line self-testing voting scheme

Author(s)
Metra, C
Favalli, M
Ricco, B
ASI Sponsor
Date Issued
1997-01-01
URI
https://hdl.handle.net/20.500.13025/423
Journal
Defect and Fault Tolerance in VLSI
URL
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=628319
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