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Fault list compaction through static timing analysis for efficient fault injection experiments
Details
Fault list compaction through static timing analysis for efficient fault injection experiments
Author(s)
Reorda, MS
Violante, M
ASI Sponsor
Date Issued
2002-01-01
URI
https://hdl.handle.net/20.500.13025/1244
Journal
Defect and Fault Tolerance in VLSI
URL
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1173523