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Highly testable and compact single output comparator
Details
Highly testable and compact single output comparator
Author(s)
Metra, C
Favalli, M
Ricco, B
ASI Sponsor
Date Issued
1997-01-01
URI
https://hdl.handle.net/20.500.13025/424
Journal
VLSI Test Symposium, 1997., 15th
URL
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=600272